Photoreflectance characterization of silicon delta-doped p-'GA''AS' (1990)
Source: Abstracts. Conference titles: International Conference of Modulation Spectroscopy. Unidade: IFQSC
Assunto: FÍSICA
ABNT
BERNUSSI, A. A. et al. Photoreflectance characterization of silicon delta-doped p-'GA''AS'. 1990, Anais.. San Diego: , Universidade de São Paulo, 1990. . Acesso em: 28 abr. 2024.APA
Bernussi, A. A., Iikawa, F., Motisuke, P., Basmaji, P., Siu Li, M., & Hipólito, O. (1990). Photoreflectance characterization of silicon delta-doped p-'GA''AS'. In Abstracts. San Diego: , Universidade de São Paulo.NLM
Bernussi AA, Iikawa F, Motisuke P, Basmaji P, Siu Li M, Hipólito O. Photoreflectance characterization of silicon delta-doped p-'GA''AS'. Abstracts. 1990 ;[citado 2024 abr. 28 ]Vancouver
Bernussi AA, Iikawa F, Motisuke P, Basmaji P, Siu Li M, Hipólito O. Photoreflectance characterization of silicon delta-doped p-'GA''AS'. Abstracts. 1990 ;[citado 2024 abr. 28 ]